HRTEM, SEM and EDX mapping study of PbS:ZnO Nanowires films deposited using thermal evaporation method

Bassam Abdallah, M. Kakhia, W. Zetoun

We were obtained ZnO Nanowires films deposited on two types of substrates (Si (100) and glass) with 12 wt % PbS as dopant by simple thermal evaporation technique. High Resolution Transmission Electron Microscopy (HRTEM) and Energy-dispersive X-ray spectroscopy (EDX) images have confirmed the formation of ZnO Nanowires (NWs). EDX technique was studied to investigate the elements content (standard analysis and mapping modes). Morphology and thickness of the films were investigated from surface and cross section of the films via scanning electron microscopy (SEM) images. The Raman, photoluminescence (PL) and X-ray Diffraction (XRD) have confirmed the hexagonal phase structure of the ZnO Nanowires, which appear to be very fine and their diameters were less than 40 nm and their lengths were of several micron using SEM and HRTEM. The effect of PbS as dopant on the growth of ZnO Nanowires as well as on the morphology for two substrates was investigated and compared. Mapping -EDX has confirmed the stoichiometry of prepared films. Finally, the structure (phase) verified by different characterizations techniques. These Nanostructures allow to potential optical application in optoelectronic field

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